Accumulation-based concurrent fault detection for linear digital state variable systems

نویسندگان

  • Ismet Bayraktaroglu
  • Alex Orailoglu
چکیده

An algorithmic fault detection scheme for linear digital state variable systems is proposed. The proposed scheme eliminates the necessity of observing the internal states of the system for concurrent fault detection by utilizing an accumulation-based approach. Observation merely of the inputs and the outputs results in significantly reduced area overhead and no performance penalty. Experimental results verify that 100% concurrent fault detection is attainable for linear digital state variable systems.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Concurrent test for digital linear systems

Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent error detection. An invariant-based concurrent error-detection scheme for linear digital systems is proposed. The cost of concurrent error-detection hardware is appreciably reduced due to utilization of a time-extended invariant, which extends the error-checking computation over time and, thus,...

متن کامل

Fault Type Estimation in Power Systems

This paper presents a novel approach for fault type estimation in power systems. The Fault type estimation is the first step to estimate instantaneous voltage, voltage sag magnitude and duration in a three-phase system at fault duration. The approach is based on time-domain state estimation where redundant measurements are available. The current based model allows a linear mapping between the m...

متن کامل

Non-Concurrent Error Detection and Correction in Fault-Tolerant Discrete-Time LTI Dynamic Systems

This paper develops resource-efficient alternatives to modular redundancy for fault-tolerant discrete-time (DT) linear time-invariant (LTI) dynamic systems. The proposed method extends previous approaches that are based on embedding the state of a given DT LTI dynamic system into the redundant state-space of a DT LTI dynamic system of higher state dimension. These embeddings, as well as the emb...

متن کامل

Concurrent Testing Embedded Systems : Adapting Automatic Control Techniques to Microelectronics Testing

This paper is aimed at exploiting Fault Detection and Isolation (FDI) techniques widely known in automatic control for solving online test problem in embedded Integrated Circuits (ICs). Before reaching this aim, we will briefly review the field of microelectronics testing, introducing basic concepts and techniques. We will next introduce FDI model-based approaches and their application for onli...

متن کامل

An approach to fault detection and correction in design of systems using of Turbo ‎codes‎

We present an approach to design of fault tolerant computing systems. In this paper, a technique is employed that enable the combination of several codes, in order to obtain flexibility in the design of error correcting codes. Code combining techniques are very effective, which one of these codes are turbo codes. The Algorithm-based fault tolerance techniques that to detect errors rely on the c...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2000